Specializing in Industrial Problem Solving,
Failure Analysis, Laboratory, and R&D

Exel-Labs Publications & Presentation

• E. A. Leone, A. J Signorelli, AlliedSignal Corp., S. Sriram, Allied Amphenol Products, P. Vohralik, VG Scientific (UK), "Characterization of Ti in-diffused waveguides using secondary ion mass spectrometry (SIMS) and electron microprobe analysis (EMPA)," Proc. SPIE-Int. Soc. Opt. Eng., 704, pp 94-101, Integr. Opt. Circuit Eng. IV, 1987.
• E. A. Leone, "Electron Microprobe X-ray Chemical Shift and Line Profile Changes in Silicon Containing Materials," pp. 1023-32 in Scanning Electron Microscopy III, SEM Inc., AMF O’Hare (Chicago), IL (1984).
• Z. Iqbal, E. Leone, R. Chin, A. J. Signorelli, A. Bose, and H. Eckhardt, "X-ray photoemission spectroscopy of the 90 K superconductor Ba₂YCu₃O_7-δ," J. Mater. Res., 2 [6], pp 768-74, (1987).
• R. van Weeren, G. Carrasquillo, E. A. Leone, S. Curran, and S. C. Danforth, "Laser-Synthesized Silicon Nitride Powder: Chemical and Physical Characteristics"; pp. 47-54 in Ceramic Transactions, Vol. 42, Silicon-Based Structural Ceramics. Edited by B. W. Sheldon and S. C. Danforth. American Ceramic Society, Westerville, OH, 1994.
• R. van Weeren, E. A. Leone, S. Curran, L. C. Klein, and S. C. Danforth, "Synthesis and Characterization of Amorphous Si₂N₂O," J. Am. Ceram. Soc., 77 [10], pp 2699-2702, (1994).
• J. D. Hewes, S. Curran, and E. A. Leone, "The Direct Fluorination of a Porous Functionalized Polymer," J. Appl. Polym. Sci., 53(3), pp 291-95, (1994).
• E. A. Leone, S. Curran, M. E. Kotun, G. Carrasquillo, R. van Weeren, and S. C. Danforth, "Solid-State ²⁹Si NMR Analysis of Amorphous Silicon Nitride Powder," J. Am. Ceram. Soc., 79 [2], pp 513-17, (1996).
• S. Campbell, E. A. Leone, M. Mcnallan, "The effect of processing parameters on the surface nitridation of Nextel 312 ceramic," Ceram. Eng. Sci. Proc., 18(4), pp 391-98, 1997.
• E. A. Leone, "The Use of Static and Dynamic SIMS in the Analysis of Ceramic and Amorphous Materials"; pp. 607-10 in Secondary Ion Mass Spectrometry, SIMS XI, Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando Florida, September 7-12, 1997. Edited by G. Gillen, R. Lareau, J. Bennett and F. Stevie. John Wiley & Sons, Chichester, UK, 1998.
• E. A. Leone and A. J. Signorelli, "Surface Analysis," Chapter 10 in A Guide to Materials Characterization and Chemical Analysis, 2nd Edition. Edited by J. P. Sibilia. VCH Publishers, Inc., NY, NY, 1998.
• E. A. Leone, A, Rabinkin, B. Sarna, "Microstructure of thin-gauge austenitic and ferritic stainless steel joints brazed using Metglas® amorphous foil," Welding in the World, 50 (no. 1/2), pp 3-15, 2006.

• E. A. Leone, G. Carrasquillo, R. van Weeren and S. C. Danforth, "The Effect of Hydrogen on the Crystallization Behavior of Laser Synthesized Silicon Nitride Powder," 96th Annual Meeting of the American Ceramic Society, Indianapolis, IN, April 24-28, 1994.
• E. A. Leone, G. Carrasquillo, R. van Weeren and S. C. Danforth, "ToF-SIMS Characterization of Laser Synthesized Silicon Nitride Powder," 96th Annual Meeting of the American Ceramic Society, Indianapolis, IN, April 24-28, 1994.
• E. H. Erenrich, E. A. Leone and R. D. Sedgwick, "Surface Analysis of High Solids Coatings Via ToF-SIMS," Waterborne High Solids and Powder Coatings Symposium, University of Southern Mississippi, February 14-16, 1996.
• E. A. Leone and S. Campbell, "Use of Secondary Ion Mass Spectrometry (SIMS) in the Analysis of Alumina-Boria-Silica Ceramic," 21st Annual Cocoa Beach Conference and Exposition on Composites, Advanced Ceramics, Materials and Structures, Cocoa Beach, Florida, January 12-16, 1997.