- JEOL Scanning Electron Microscope (SEM) with LaB6 Source, SEI, BEI, EDX andAutomated WDX Analysis
- JEOL Field Emission SEM with EDX
- Veeco Dimension 3100 AFM/SPM
- Sputtering Systems
- Optical Microscopes
- Zeiss Stereomicroscopes
- Accelerated Life Test Units
- Residual Gas Analysis (RGA)
- Struers High Precision Polishers
- Denton Metal/Carbon Evaporation
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